Characterization methods for solid surfaces and nanomaterials

Characterization methods for solid surfaces and nanomaterials
Master ChimieParcours Sciences analytiques

Composantes2 composantes associées
Credits3 crédits

Description

Introduction to the main spectroscopic and microscopic techniques for the analysis of solid surfaces and nanomaterials:
- Introduction to solid surfaces and interfaces. Basic principles of surface spectroscopy.
- Introduction to Vacuum technology.
- Photoelectron and Auger electron spectroscopies (XPS, UPS, AES).
- Thermal desorption spectroscopies (TDS,TPR ext).
- Ion spectroscopies (SIMS, LEIS).
- Vibrational spectroscopies (IR, EELS).
- Basic techniques to determine the surface structure (LEED, RHEED, PED ext).
- Surface microscopy and related techniques (AFM, STM, SEM, TEM).
- Synchrotron radiation and surface analysis (X-ray absorption EXAFS & SEXAFS, X-ray microscopy SPEM, ext.)
- Analysis of nano-scale materials using surface sensitive techniques.
- Research strategies and Case studies related to Catalyst Characterization.
- Visit to the Surface Analysis Laboratory (optional)
 

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